March Algorithm - Revision history

Laura240406: Cleaned up article content (via article-cleaner)

2025-05-27T19:12:03Z

Cleaned up article content (via article-cleaner)

← Previous revision		Revision as of 19:12, 27 May 2025
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	The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:		The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:
	* [[Stuck-~~at_fault~~\|Stuck-at Faults (SAFs)]]		* [[Stuck-at fault\|Stuck-at Faults (SAFs)]]
	* [[Transition Fault\|Transition Faults (TFs)]]		* [[Transition Fault\|Transition Faults (TFs)]]
	* Address Decoder Faults (AFs)		* Address Decoder Faults (AFs)
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	[[Category:Algorithms]]		[[Category:Algorithms]]


	{{Algorithm-stub}}		{{Algorithm-stub}}

GalStar: Add links for some faults

2025-05-27T04:28:12Z

Add links for some faults

← Previous revision		Revision as of 04:28, 27 May 2025
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	The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:		The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:
	* Stuck-at Faults (SAFs)		* [[Stuck-at_fault\|Stuck-at Faults (SAFs)]]
	* Transition Faults (TFs)		* [[Transition Fault\|Transition Faults (TFs)]]
	* Address Decoder Faults (AFs)		* Address Decoder Faults (AFs)
	* Coupling Faults (CFs), such as Inversion (CFin), Idempotent (CFid), and State (CFst) coupling faults		* Coupling Faults (CFs), such as Inversion (CFin), Idempotent (CFid), and State (CFst) coupling faults

GalStar: modify about

2025-05-27T04:25:00Z

modify about

← Previous revision		Revision as of 04:25, 27 May 2025
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	{{Short description\|A memory testing algorithm}}		{{Short description\|A memory testing algorithm}}
	{{About\|the memory ~~test~~ algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory testing algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

GalStar: Modify short description

2025-05-27T04:24:41Z

Modify short description

← Previous revision		Revision as of 04:24, 27 May 2025
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	{{Short description\|A memory ~~test~~ algorithm}}		{{Short description\|A memory testing algorithm}}
	{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

GalStar: Fix typo

2025-05-26T02:28:16Z

Fix typo

← Previous revision		Revision as of 02:28, 26 May 2025
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	* Ascending: Read 0		* Ascending: Read 0

	== ~~Mach~~ C- ==		== March C- ==
	~~Mach~~ C- is a less robust variant of the March algorithm that detects Address and Coupling faults, but it is significantly faster.		March C- is a less robust variant of the March algorithm that detects Address and Coupling faults, but it is significantly faster.

	=== Test sequence ===		=== Test sequence ===

Agent VII: +{{Algorithm-stub}} using StubSorter

2025-05-25T09:56:00Z

+{{Algorithm-stub}} using StubSorter

← Previous revision		Revision as of 09:56, 25 May 2025
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	[[Category:Algorithms]]		[[Category:Algorithms]]

			{{Algorithm-stub}}

Agent VII: Adding short description: "A memory test algorithm"

2025-05-25T09:55:25Z

Adding short description: "A memory test algorithm"

← Previous revision		Revision as of 09:55, 25 May 2025
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			{{Short description\|A memory test algorithm}}
	{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

Laura240406: added about tag

2025-05-25T07:10:15Z

added about tag

← Previous revision		Revision as of 07:10, 25 May 2025
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			{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

Laura240406: change lead a bit

2025-05-25T07:05:36Z

change lead a bit

← Previous revision		Revision as of 07:05, 25 May 2025
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	The '''March algorithm''' tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

	The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:		The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.<ref>{{Cite web \|title=Documentation – Arm Developer \|url=https://developer.arm.com/documentation/101528/0001/Production-test-March-Algorithm/Production-test-March-algorithm-overview \|access-date=2025-05-25 \|website=developer.arm.com}}</ref><ref>{{cite journal \| last=Van De Goor \| first=A.J. \| title=Using march tests to test SRAMs \| journal=IEEE Design & Test of Computers \| volume=10 \| issue=1 \| date=1993 \| issn=0740-7475 \| doi=10.1109/54.199799 \| doi-access=free \| pages=8–14 \| url=https://repository.tudelft.nl/islandora/object/uuid%3Afcfc792d-e8cf-4c0f-ab07-0c064f328eca/datastream/OBJ/download \| access-date=2025-05-25}}</ref> The March algorithm is often used to find functional faults in SRAM during testing<ref>{{Cite journal \|date=August 10, 2009 \|title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \|url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \|journal=IEICE Electronics Express \|volume=6 \|issue=15}}</ref> such as:

Laura240406: added paper

2025-05-25T07:03:27Z

added paper

← Previous revision		Revision as of 07:03, 25 May 2025
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	* Address Decoder Faults (AFs)		* Address Decoder Faults (AFs)
	* Coupling Faults (CFs), such as Inversion (CFin), Idempotent (CFid), and State (CFst) coupling faults		* Coupling Faults (CFs), such as Inversion (CFin), Idempotent (CFid), and State (CFst) coupling faults

			It has been suggested to test SRAM modules using the algorithm before sale using a [[built-in self-test]] mechanism.<ref>{{cite web \| title=SRAM Memory Built in Self-Test using MARCH Algorithm \| website=IEEE Xplore \| date=November 24, 2022 \| url=https://ieeexplore.ieee.org/document/10010813 \| access-date=May 25, 2025}}</ref>

	== Test sequence ==		== Test sequence ==

← Previous revision		Revision as of 04:25, 27 May 2025
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	{{Short description\|A memory testing algorithm}}		{{Short description\|A memory testing algorithm}}
	{{About\|the memory ~~test~~ algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory testing algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

← Previous revision		Revision as of 04:24, 27 May 2025
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	{{Short description\|A memory ~~test~~ algorithm}}		{{Short description\|A memory testing algorithm}}
	{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.

← Previous revision		Revision as of 09:55, 25 May 2025
Line 1:		Line 1:
			{{Short description\|A memory test algorithm}}
	{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}		{{About\|the memory test algorithm\|convex hull algorithm called Jarvis march algorithm\|Gift wrapping algorithm}}
	The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.		The '''March algorithm''' is a widely used<ref>{{cite journal \| last=Masnita \| first=M. I. \| last2=Zuha \| first2=W. H. W. \| last3=Sidek \| first3=R. M. \| last4=Izhal \| first4=A. H. \| title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults \| journal=IEICE Electronics Express \| publisher=Institute of Electronics, Information and Communications Engineers (IEICE) \| volume=6 \| issue=15 \| year=2009 \| issn=1349-2543 \| doi=10.1587/elex.6.1091 \| doi-access=free \| pages=1091–1097 \| url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf \| access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM\|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.