March Algorithm: Difference between revisions
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{{Short description|A memory test algorithm}} |
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{{About|the memory test algorithm|convex hull algorithm called Jarvis march algorithm|Gift wrapping algorithm}} |
{{About|the memory test algorithm|convex hull algorithm called Jarvis march algorithm|Gift wrapping algorithm}} |
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The '''March algorithm''' is a widely used<ref>{{cite journal | last=Masnita | first=M. I. | last2=Zuha | first2=W. H. W. | last3=Sidek | first3=R. M. | last4=Izhal | first4=A. H. | title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults | journal=IEICE Electronics Express | publisher=Institute of Electronics, Information and Communications Engineers (IEICE) | volume=6 | issue=15 | year=2009 | issn=1349-2543 | doi=10.1587/elex.6.1091 | doi-access=free | pages=1091–1097 | url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf | access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns. |
The '''March algorithm''' is a widely used<ref>{{cite journal | last=Masnita | first=M. I. | last2=Zuha | first2=W. H. W. | last3=Sidek | first3=R. M. | last4=Izhal | first4=A. H. | title=March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults | journal=IEICE Electronics Express | publisher=Institute of Electronics, Information and Communications Engineers (IEICE) | volume=6 | issue=15 | year=2009 | issn=1349-2543 | doi=10.1587/elex.6.1091 | doi-access=free | pages=1091–1097 | url=https://www.jstage.jst.go.jp/article/elex/6/15/6_15_1091/_pdf | access-date=May 25, 2025}}</ref> algorithm that tests [[Static RAM|SRAM]] memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns. |
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Revision as of 09:55, 25 May 2025
The March algorithm is a widely used[1] algorithm that tests SRAM memory by filling all its entries test patterns. It carries out several passes through an SRAM checking the patterns and writing new patterns.
The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry.[2][3] The March algorithm is often used to find functional faults in SRAM during testing[4] such as:
- Stuck-at Faults (SAFs)
- Transition Faults (TFs)
- Address Decoder Faults (AFs)
- Coupling Faults (CFs), such as Inversion (CFin), Idempotent (CFid), and State (CFst) coupling faults
It has been suggested to test SRAM modules using the algorithm before sale using a built-in self-test mechanism.[5]
Test sequence
- Ascending: Write 0 to all cells.
- Ascending: Read 0, then write 1.
- Ascending: Read 1, then write 0.
- Ascending: Read 0.
- Descending: Read 0, then write 1.
- Descending: Read 1, then write 0.
- Ascending: Read 0
Mach C-
Mach C- is a less robust variant of the March algorithm that detects Address and Coupling faults, but it is significantly faster.
Test sequence
- Ascending: Write 0 to all cells.
- Ascending: Read 0, then write 1.
- Ascending: Read 1, then write 0.
- Descending: Read 0, then write 1.
- Descending: Read 1, then write 0.
- Ascending: Read 0.
References
- ^ Masnita, M. I.; Zuha, W. H. W.; Sidek, R. M.; Izhal, A. H. (2009). "March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults". IEICE Electronics Express. 6 (15). Institute of Electronics, Information and Communications Engineers (IEICE): 1091–1097. doi:10.1587/elex.6.1091. ISSN 1349-2543. Retrieved May 25, 2025.
- ^ "Documentation – Arm Developer". developer.arm.com. Retrieved 2025-05-25.
- ^ Van De Goor, A.J. (1993). "Using march tests to test SRAMs". IEEE Design & Test of Computers. 10 (1): 8–14. doi:10.1109/54.199799. ISSN 0740-7475. Retrieved 2025-05-25.
- ^ "March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults". IEICE Electronics Express. 6 (15). August 10, 2009.
- ^ "SRAM Memory Built in Self-Test using MARCH Algorithm". IEEE Xplore. November 24, 2022. Retrieved May 25, 2025.