March Algorithm
The March algorithm (or the March MBIST algorithm) tests SRAM memory by filling all its entries test patterns It carries out several passes through an SRAM checking the patterns and writing new patterns. The SRAM read and write operations performed on each pass are called a March element and each element is repeated for each entry [1] [2]. The March algorithm is often used to find functional faults in SRAM during testing [3].
- ^ "Documentation – Arm Developer". developer.arm.com. Retrieved 2025-05-25.
- ^ Van De Goor, A.J. (1993-03). "Using march tests to test SRAMs". IEEE Design & Test of Computers. 10 (1): 8–14. doi:10.1109/54.199799. ISSN 1558-1918.
{{cite journal}}: Check date values in:|date=(help) - ^ "March-based SRAM diagnostic algorithm for distinguishing Stuck-At and transition faults". IEICE Electronics Express. 6 (15). August 10, 2009.