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Design Automation and Test in Europe

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DATE, Design Automation and Test in Europe
StatusActive
FrequencyAnnual
Years active27
FoundedFebruary 1998; 27 years ago (1998-02) in Paris, France
Next eventDATE2025 in Lyon, France
Participants1200
AreaElectronic design automation
SponsorsACM Special Interest Group on Design Automation (SIGDA), the Electronic System Design Alliance (ESDA), the European Design and Automation Association (EDAA), and the IEEE Council on Electronic Design Automation (CEDA)
WebsiteDATE

Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design automation, typically held in March or April, alternating between France and Germany.[1][2] DATE is a combination of a technical conference and a small trade show. It was formed in 1998 as a merger of EDAC, ETC, Euro-ASIC, and Euro-DAC.[3] It is sponsored by the SIGDA of the Association for Computing Machinery, the Electronic System Design Alliance, the European Design and Automation Association (EDAA),[4] and the IEEE Council on Electronic Design Automation (CEDA). Technical co-sponsors include ACM SIGBED, the IEEE Solid-State Circuits Society (SSCS), IFIP, and the Institution of Engineering and Technology (IET).

Areas of submission

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The DATE conference invites research papers in many areas related to electronic design automation. These topics are grouped into four main tracks: design methods, applications, testing, and embedded systems:[5]

  • Track D:[6] Design Methods and Tools covers research on how to build better design tools and methods. Topics include high-level synthesis, system simulation, formal verification, low-power and secure design, reconfigurable systems, and new ideas like quantum computing and approximate computing.
  • Track A:[7] Application Design focuses on real-world examples. It includes designs for smart energy systems, secure and autonomous systems, artificial intelligence, and new technologies used in practical ways.
  • Track T:[8] Test and Dependability is about testing and reliability. It includes fault detection, circuit testing, secure system validation, and ways to make sure systems work even when there are errors.
  • Track E:[9] Embedded Systems Design includes software and hardware for embedded and cyber-physical systems. Topics cover real-time systems, secure systems, software tools, and using machine learning in embedded devices.

Each track has several specific topics. Authors can choose the one that fits their work. All papers are peer-reviewed and must present original and useful research.

Young People Programme

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The DATE conference hosts the Young People Programme, an initiative aimed at supporting early-career researchers and strengthening academic-industry connections. First introduced in 2019, the program offers career development resources for master's students, PhD candidates, and postdoctoral researchers. It also provides introduces companies and universities to potential employees. The programme includes networking events, mentorship opportunities, and recruiting activities to help participants explore career paths and build professional relationships.[10]

Conference archive

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The following table lists past editions of the DATE (Design, Automation and Test in Europe) conference, including the host cities and years. A full archive of events and proceedings is available on the official DATE website.[11] Additional bibliographic information is available through the DBLP computer science bibliography.[12] Proceedings for each year are accessible via IEEE Xplore.[13]

Year Location Proceedings
2025 Lyon, France [14]
2024 Valencia, Spain [15]
2023 Antwerp, Belgium [16]
2022 Antwerp, Belgium [17]
2021 Grenoble, France [18]
2020 Grenoble, France [19]
2019 Florence, Italy [20]
2018 Dresden, Germany [21]
2017 Lausanne, Switzerland [22]
2016 Dresden, Germany [23]
2015 Grenoble, France [24]
2014 Dresden, Germany [25]
2013 Grenoble, France [26]
2012 Dresden, Germany [27]
2011 Grenoble, France [28]
2010 Dresden, Germany [29]
2009 Nice, France [30]
2008 Munich, Germany [31]
2007 Nice, France [32]
2006 Munich, Germany [33]
2005 Munich, Germany [34]
2004 Paris, France [35]
2003 Munich, Germany [36]
2002 Paris, France [37]
2001 Munich, Germany [38]
2000 Paris, France [39]
1999 Munich, Germany [40]
1998 Paris, France [41]

Late Breaking Results

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The DATE conference offers a special track for Late Breaking Results (LBR). This track allows researchers to share new ideas, early-stage findings, or innovative directions that are still in progress. LBR submissions are limited to two pages and must follow the official template. All submissions are reviewed through a blind peer-review process. Selected papers are presented in interactive sessions, where authors can receive feedback and discuss their work with the community.[5]

See also

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References

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  1. ^ Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE 2022). European Design and Automation Association. 2022. ISBN 978-3-9819263-6-1. OCLC 1327747814.
  2. ^ "Design, Automation, and Test in Europe proceedings 1998-2023". Association for Computing Machinery Digital Library.
  3. ^ Proceedings of the conference on Design, automation, and test in Europe (DATE 1998). IEEE Computer Society. 1998. ISBN 978-0-8186-8359-6. OCLC 1112536591.
  4. ^ "European Design and Automation Association | home page". www.edaa.com.
  5. ^ a b DATE Conference – Call for Papers
  6. ^ Track D – DATE Technical Program Committee
  7. ^ Track A – DATE Technical Program Committee
  8. ^ Track T – DATE Technical Program Committee
  9. ^ Track E – DATE Technical Program Committee
  10. ^ DATE Conference – Young People Programme
  11. ^ DATE Conference Archive
  12. ^ DBLP – DATE Conference Proceedings Archive
  13. ^ IEEE Xplore Digital Library
  14. ^ IEEE Xplore
  15. ^ IEEE Xplore
  16. ^ IEEE Xplore
  17. ^ IEEE Xplore
  18. ^ IEEE Xplore
  19. ^ IEEE Xplore
  20. ^ IEEE Xplore
  21. ^ IEEE Xplore
  22. ^ IEEE Xplore
  23. ^ IEEE Xplore
  24. ^ IEEE Xplore
  25. ^ IEEE Xplore
  26. ^ IEEE Xplore
  27. ^ IEEE Xplore
  28. ^ IEEE Xplore
  29. ^ IEEE Xplore
  30. ^ IEEE Xplore
  31. ^ IEEE Xplore
  32. ^ IEEE Xplore
  33. ^ IEEE Xplore
  34. ^ IEEE Xplore
  35. ^ IEEE Xplore
  36. ^ IEEE Xplore
  37. ^ IEEE Xplore
  38. ^ IEEE Xplore
  39. ^ IEEE Xplore
  40. ^ IEEE Xplore
  41. ^ IEEE Xplore
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